发明名称 Measuring chip for a surface plasmon resonance measurement apparatus
摘要 <p>A measuring chip (10) comprising a dielectric block (11) and a thin film layer (12) formed on one surface (11a) of the dielectric block (11). The thin film layer (12) is used for placing a sample (15) thereon. The dielectric block (11) is formed as a single block, which includes an entrance surface (11b) at which a light beam (30) enters the dielectric block (11), an exit surface (11c) from which the light beam emerges, and the one surface (11a) on which the thin film layer (12) is formed. In addition, the dielectric block (11) is integrated with the thin film layer (12) and formed from a resin whose photoelastic coefficient is less than 50 x 10<-12> Pa<-1>. <IMAGE></p>
申请公布号 EP1319940(A1) 申请公布日期 2003.06.18
申请号 EP20020027843 申请日期 2002.12.12
申请人 FUJI PHOTO FILM CO., LTD. 发明人 MORI, NOBUFUMI;TANI, TAKEHARU;MUKAI, ATSUSHI
分类号 G01N21/03;G01N21/27;G01N21/41;G01N35/04;G01N35/10;(IPC1-7):G01N21/55 主分类号 G01N21/03
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