发明名称 PROBING METHOD USING ION TRAP MASS SPECTROMETER AND PROBING DEVICE
摘要 In a detecting device based on mass spectrometry, fast screening is conducted by using a step (201) of acquiring a mass spectrum and a step (202) of deciding if ions of an intrinsic m/z are present. In accordance with the decision results from the decision step (202), a step (203) of conducting tandem mass spectrometry is switched to so as to make detailed checking. A step (204) of deciding if ions of peculiar m/z are present is executed on the basis of the results obtained by the tandem mass spectrometry. An alarm is issued according to the decision result step (205). Thus, fast and less-misreporting detecting can be performed. <IMAGE>
申请公布号 EP1319945(A1) 申请公布日期 2003.06.18
申请号 EP20000961110 申请日期 2000.09.20
申请人 HITACHI, LTD. 发明人 TAKADA, YASUAKI;SAKAIRI, MINORU
分类号 H01J49/42;B01D59/44;G01N33/00 主分类号 H01J49/42
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