发明名称 LORENTZ FORCE MICROSCOPE AND METHOD FOR MEASURING MAGNETIC DOMAIN USING LORENTZ FORCE
摘要 PURPOSE: A Lorentz force microscope and a method for measuring a magnetic domain using Lorentz force are provided to improve the resolution of a magnetization distribution chart by detecting the magnetizing direction of the magnetic domain. CONSTITUTION: A Lorentz force microscope includes a conductive probe(21), a lower electrode(23), a scanner(25), and an information detection portion(30). The conductive probe is driven by Lorentz force which is generated by the magnetic field of a magnetic medium(20) and the interaction between the current and the magnetic field. The lower electrode is installed at one side of the magnetic medium in order to electrify the magnetic medium. The scanner is used for supporting and driving the magnetic medium and scanning a recording side of the magnetic medium. The detection portion controls the scanner and detects magnetization information of the magnetic medium.
申请公布号 KR20030047162(A) 申请公布日期 2003.06.18
申请号 KR20010077578 申请日期 2001.12.08
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 HONG, SEUNG BEOM;JUN, JONG EOP;SHIN, HYEON JEONG
分类号 G02B21/00;G01R33/038;(IPC1-7):G02B21/00 主分类号 G02B21/00
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