发明名称 |
SEMICONDUCTOR THIN FILM DEVICE, ITS MANUFACTURING METHOD, AND IMAGE DISPLAY DEVICE |
摘要 |
PURPOSE: To control grain boundaries, particle diameters, and crystal orientations on an insulating substrate. CONSTITUTION: A semiconductor thin film device has a semiconductor thin film having a thickness of≤200 nm and formed on an insulating transparent substrate having a distortion spot of≤600°. The semiconductor thin film has an area where first semiconductor thin film areas having defect densities of <1x10¬17 cm¬-3 and second semiconductor thin film areas having defect densities of≧1x10¬17 cm¬-3 are alternately arranged in a stripe-like state. The first semiconductor thin film areas have widths broader than the second semiconductor thin film areas have. Consequently, a semiconductor thin film device having a high-quality semiconductor thin film can be obtained.
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申请公布号 |
KR20030047678(A) |
申请公布日期 |
2003.06.18 |
申请号 |
KR20020039683 |
申请日期 |
2002.07.09 |
申请人 |
KABUSHIKI KAISHA HITACHI SEISAKUSHO(D/B/A HITACHI, LTD.) |
发明人 |
HATANO MUTSUKO;YAMAGUCHI SHINYA;SHIBA TAKEO |
分类号 |
H01L21/20;H01L21/336;H01L21/77;H01L21/84;H01L27/12;H01L29/04;H01L29/786;(IPC1-7):H01L21/20 |
主分类号 |
H01L21/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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