发明名称 SEMICONDUCTOR THIN FILM DEVICE, ITS MANUFACTURING METHOD, AND IMAGE DISPLAY DEVICE
摘要 PURPOSE: To control grain boundaries, particle diameters, and crystal orientations on an insulating substrate. CONSTITUTION: A semiconductor thin film device has a semiconductor thin film having a thickness of≤200 nm and formed on an insulating transparent substrate having a distortion spot of≤600°. The semiconductor thin film has an area where first semiconductor thin film areas having defect densities of <1x10¬17 cm¬-3 and second semiconductor thin film areas having defect densities of≧1x10¬17 cm¬-3 are alternately arranged in a stripe-like state. The first semiconductor thin film areas have widths broader than the second semiconductor thin film areas have. Consequently, a semiconductor thin film device having a high-quality semiconductor thin film can be obtained.
申请公布号 KR20030047678(A) 申请公布日期 2003.06.18
申请号 KR20020039683 申请日期 2002.07.09
申请人 KABUSHIKI KAISHA HITACHI SEISAKUSHO(D/B/A HITACHI, LTD.) 发明人 HATANO MUTSUKO;YAMAGUCHI SHINYA;SHIBA TAKEO
分类号 H01L21/20;H01L21/336;H01L21/77;H01L21/84;H01L27/12;H01L29/04;H01L29/786;(IPC1-7):H01L21/20 主分类号 H01L21/20
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