| 摘要 |
PURPOSE: A connector for testing a semiconductor device is provided to set a heat radiating unit in a semiconductor device testing connector to optimize the temperature state of the device according to the testing condition. CONSTITUTION: A connector for testing a semiconductor device(3) includes a test lead that corresponds to a lead of the semiconductor device to test the semiconductor device. A heat sink(10) is placed between the leads, closely adhering to the plane of the semiconductor device. The heat sink has an elastic member(35) for improving contact effect of the semiconductor device and the heat sink. The heat sink is connected to a heat radiating pipe(15) to emit heat of the connector to the outside.
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