发明名称 TEST BUTTON DEVICE OF THERMAL OVERLOAD RELAY
摘要 PURPOSE: A test button device is provided to be capable of improving a user convenience by enabling a test operation at once without a complicate operating procedure. CONSTITUTION: A push part(20c) is formed at a projection part(20b) of a test button(20) so as to have a predetermined length. The push part(20c) is configured to be contact with one side of the second fixing terminal(16). When a user pushes the test button(20) downward, the second fixing terminal(16) is moved downward by a pressure of the push part(20) so as to be separated from the second moving terminal(15). The second fixing terminal(16) contacted with the push part(20c) is elastically configured to be moved upward and downward.
申请公布号 KR20030047398(A) 申请公布日期 2003.06.18
申请号 KR20010077878 申请日期 2001.12.10
申请人 LG IND. SYSTEMS CO., LTD. 发明人 LEE, GYEONG GU
分类号 H01H61/00;(IPC1-7):H01H61/00 主分类号 H01H61/00
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