| 摘要 |
An integrated circuit includes an embedded memory device and an on-chip test circuit. The on-chip test circuit includes a multiplexer and one or more I/O circuits. The multiplexer allows the I/O circuits to interface with a plurality of inputs and outputs associated with the embedded memory device. As a result, the embedded memory device in the integrated circuit may be tested or repaired after the embedded memory array portion of the integrated circuit is formed, yet prior to fabrication of dedicated input/output circuitry. This allows evaluation of the embedded memory device in the integrated circuit prior to committing resources to complete fabrication of the entire integrated circuit.
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