发明名称 Self-calibrating measuring setup for interference spectroscopy
摘要 A procedure is described to calibrate an optical converter, especially for use in the field of reflectrometric interference spectroscopy. The converter has a layer/substrate system with a layer and a substrate. A light beam shines from the substrate side, and parts of it are reflected or transmitted at the interfaces of air/substrate, substrate/layer and layer/air. The converter in particular serves to convert the light beam into a modulated (especially frequency modulated or phase modulated) signal. The light is varied within a wavelength or frequency range from which a corresponding modulated spectrum is determined. In particular, it is assumed that the performance quantities of especially the converter and a radiation source generating the light are subject to temporal fluctuations. The calibration is carried out in particular by determining reference values of the modulated spectrum at time t=0, successively determining values of the modulated spectrum for times t>0, and calculating temporal changes in the modulated spectrum for t>0 using in particular a linear disturbance equation based on the assumed infinitisimal changes in at least one of the performance quantities so the interference spectroscopy measuring setup.
申请公布号 US6580510(B2) 申请公布日期 2003.06.17
申请号 US20000727548 申请日期 2000.12.04
申请人 AGILENT TECHNOLOGIES INC. 发明人 NAWRACALA BERND
分类号 G01J3/28;G01J3/45;(IPC1-7):G01B9/02 主分类号 G01J3/28
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