| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a structure analysis method for accurately analyzing the structure and composition of a carbon material to be measured based on the X-ray diffraction data of the carbon material to be measured by utilizing a statistical method. <P>SOLUTION: The structure method is used to analyze the carbon material to be measured by utilizing a theoretical scattering strength expression expressed by the sum of scattering strength obtained by multiplying each of theoretical scattering strength regarding a plurality of model crystals where carbon model net surfaces prescribed by structure parameters (lattice contact a<SB>0</SB>, crystal size La) regarding the carbon net surface are laminated by M layers at a specific face interfal of d<SB>002</SB>, theoretical scattering strength regarding a substitution group combined with the carbon model net surface, theoretical scattering strength regarding a crosslinking combination group (methylene group, biphenyl group) for combining the carbon model net surfaces, and theoretical scattering strength regarding hetero atoms (nitrogen, oxygen, sulfur, and metal atom) other than carbon by a weight coefficient each. Based on the X-axis diffraction profile of the carbon material to be measured, the weight coefficient of the theoretical scattering strength expression is calculated by the least square method, thus analyzing the structure and composition of the carbon material to be measured. <P>COPYRIGHT: (C)2003,JPO</p> |
