发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide technology for increasing the manufacturing yield of a collectively molded package by preventing the generation of voids on its appearance. SOLUTION: A region of a resist 6 on a substrate 2 below the entire outer circumference or at least either one side of the outer circumference of a collectively molded sealing resin 9, or a region below the air vent 11 of a molding die is removed by a specified width. Since the region serves as an air vent or a convenient resin reservoir, voids are not trapped easily thus preventing the generation of voids on its appearance. COPYRIGHT: (C)2003,JPO
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申请公布号 |
JP2003168696(A) |
申请公布日期 |
2003.06.13 |
申请号 |
JP20010368122 |
申请日期 |
2001.12.03 |
申请人 |
HITACHI LTD;HITACHI TOKYO ELECTRONICS CO LTD |
发明人 |
OBATA KAZUHIKO;KURATOMI BUNJI;SHIMIZU FUKUMI;IMURA KENICHI |
分类号 |
H01L21/56;(IPC1-7):H01L21/56 |
主分类号 |
H01L21/56 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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