| 摘要 |
PROBLEM TO BE SOLVED: To solve a problem that the quality of data transmitted and received through a data bus is impaired by the reflection from each memory module, in a semiconductor memory device provided with two or more memory modules and performing high-speed operation of 100 MHz or more. SOLUTION: It is found that the deterioration of the data quality is caused by the reflection from each memory module and the branching of the data bus, so that a switch circuit is mounted near a branch point of the data bus, and the memory modules are selectively operated by the switch circuit. COPYRIGHT: (C)2003,JPO
|
