发明名称 POWER SUPPLY RELAY CIRCUIT FOR SAMPLE AND SEMICONDUCTOR TEST DEVICE
摘要 PROBLEM TO BE SOLVED: To monitor power supply voltage supplied to a measured device 80 with an external connecting device 60 still put in the connecting state while a device test is performed. SOLUTION: Power supplied from a power supply unit 10 is supplied to the measured device 80 through a repeater relay 22, and output to a check connector 40 through a power supply selection circuit 30. In the power supply selection circuit 30, a selection control part 31 controls ON/OFF state of a selection relay 35 according to a control signal input from a CPU 70. COPYRIGHT: (C)2003,JPO
申请公布号 JP2003167026(A) 申请公布日期 2003.06.13
申请号 JP20010366753 申请日期 2001.11.30
申请人 ANDO ELECTRIC CO LTD 发明人 ITO KOJI
分类号 G01R31/28;(IPC1-7):G01R31/28 主分类号 G01R31/28
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