发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 <p><P>PROBLEM TO BE SOLVED: To make uniform the transistor characteristics of TFTs at a high level and to manufacture the TFTs more efficiently while taking account of element characteristics required for respective regions depending on a region especially requiring high speed driving of TFT and a region not requiring high speed driving so much. <P>SOLUTION: A first region requiring a high driving capacity is irradiated with CW laser light at a low rate under a state where an a-Si film is patterned by lithography and etching into an island pattern 11 (or a ribbon pattern) whereas a second region not requiring a high driving capacity is irradiated with the CW laser light in the form of a solid a-Si film. <P>COPYRIGHT: (C)2003,JPO</p>
申请公布号 JP2003168691(A) 申请公布日期 2003.06.13
申请号 JP20010367051 申请日期 2001.11.30
申请人 FUJITSU LTD 发明人 TAKEI MICHIKO;HARA AKITO
分类号 G02F1/1368;H01L21/20;H01L21/336;H01L29/786;(IPC1-7):H01L21/336;G02F1/136 主分类号 G02F1/1368
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