发明名称 Thick thermal oxide layers and isolation regions in a silicon-containing substrate for high voltage applications
摘要 Disclosed is a method of forming a thick silicon oxide layer upon or internal to a silicon structure. The method is particularly useful in creating isolation regions within a silicon-containing structure, where such isolation regions can withstand high voltages. The electrically isolating thick silicon oxide layer or isolation regions can be shaped, machined, or etched to provide feedthroughs for vertical or horizontal interconnects. The feedthroughs may be coated with metal or filled with metal to provide the interconnect.
申请公布号 US2003109122(A1) 申请公布日期 2003.06.12
申请号 US20010006306 申请日期 2001.12.06
申请人 GROSS HARALD S. 发明人 GROSS HARALD S.
分类号 H01L21/302;H01L21/316;H01L21/3205;H01L21/4763;H01L21/762;H01L21/768;H01L23/48;(IPC1-7):H01L21/320;H01L21/476 主分类号 H01L21/302
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