发明名称 Reference gauge for calibrating a measuring machine and method for calibrating a measuring machine
摘要 Reference gauge for calibrating measuring machines whose reference dimension can be measured both on its inner size and by its outer size, thus making it possible to keep the reference dimension less than 15 millimeters, even for calibrating measuring machines equipped with probe tips having a diameter greater than that dimension. The calibration method with the aid of such a reference gauge comprises in certain cases the measuring of the calibrated distance between two outer surfaces of a protruding volume.
申请公布号 US2003106229(A1) 申请公布日期 2003.06.12
申请号 US20020314832 申请日期 2002.12.09
申请人 JORDIL PASCAL;ZUFFEREY CHARLES-HENRI;ZANIER ADRIANO 发明人 JORDIL PASCAL;ZUFFEREY CHARLES-HENRI;ZANIER ADRIANO
分类号 G01B3/30;G01B3/32;G01B21/04;(IPC1-7):G01D21/00 主分类号 G01B3/30
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