发明名称 PROBE DEVICE AND PROBE METHOD
摘要 <p>A probe device (20) having a contact load monitoring device (10). This contact load monitoring device measures the displacement of a loading table caused by a contact load exerted on the mounting table from a probe in an overdrive by means of a displacement sensor (11) disposed in the space below the mounting table as a sinkage quantity. This sinkage quantity is collated with a correlation table to determine the contact load. If the contact load is less than the design contact load, the mounting table is further overdriven.</p>
申请公布号 WO2003049179(P1) 申请公布日期 2003.06.12
申请号 JP2002011792 申请日期 2002.11.12
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