发明名称 |
IMPROVING INTEGRATED CIRCUIT PERFORMANCE AND RELIABILITY USING A PATTERNED BUMP LAYOUT ON A POWER GRID |
摘要 |
A method for improving integrated circuit by using a patterned bump layout on a metal layer of the integrated circuit is provided. The method creates various bump structures by varying an angle between a line from a reference bump to a first bump and a line from the reference bump to a second bump. By varying the angle, a designer may generate a particular bump structure that meets the needs of a particular design. Further, a particular bump placement may be repeated across all or a portion of the metal layer in order to create a patterned bump layout. |
申请公布号 |
WO03048981(A2) |
申请公布日期 |
2003.06.12 |
申请号 |
WO2002US37643 |
申请日期 |
2002.11.25 |
申请人 |
SUN MICROSYSTEMS, INC. |
发明人 |
BOBBA, SUDHAKAR;THORP, TYLER, J.;LIU, DEAN;TRIVEDI, PRADEEP, R. |
分类号 |
G06F17/50;H01L21/60;H01L21/82;H01L21/822;H01L23/485;H01L23/50;H01L23/528;H01L27/04;H05K1/02;H05K1/11;H05K3/34 |
主分类号 |
G06F17/50 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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