| 摘要 |
An embedded electronic sxstem built-in self-test controller architecture tha t facilitates testing and debugging of electronic circuits and in-system configuration of programmable devices. The system BIST controller architectu re includes an embedded system BIST controller, an embedded memory circuit, an embedded IEEE 1149.1 bus, and an external controller connector. The system BIST controller is coupled to the memory circuit and the IEEE 1149.1 bus, an d coupleable to an external test controller via the external controller connector. The external test controller can communicate over the IEEE 1149.1 bus to program the memory and/or the system BIST controller circuitry, there by enabling scan vectors to be debugged by the external test controller and the n downloaded into the memory for subsequent application to a unit under test b y the system BIST controller.
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