| 摘要 |
A contact probe for a testing head is described, the probe having at least a pointed rod-shaped body (4) having a crook-shaped section (6) capable to contact mechanically and electrically at least one contact pad (7) of an electronic device (10) to be tested and defined form an elbow point (G) on the rod-shaped body (4). Advantageously according to the invention, the rod-shaped body (4) comprises at least one additional elbow point (Ga) spaced form the elbow point (G). <IMAGE> |
