发明名称 Apparatus and method for determining compliance margin of a waveform relative to a standard
摘要 Compliance margin of a waveform is determined relative to a standard, indicating the extent to which the waveform either complies or fails to comply with the standard. An acquisition system captures the waveform of an applied signal in a display space, and a memory stores a representation of a series of scaled masks in the display space. Each scaled mask in the series is a version of the standard that is scaled relative to the standard according to a corresponding scale factor. A comparator determines which scaled masks in the series coincide with the waveform at one or more predesignated locations in the display space by comparing the waveform to the represented series of scaled masks at the one or more locations. An output device indicates the compliance margin of the waveform based on the corresponding scale factors of the scaled masks that coincide with the waveform at the one or more locations in the display space.
申请公布号 US6577964(B1) 申请公布日期 2003.06.10
申请号 US20000605579 申请日期 2000.06.28
申请人 AGILENT TECHNOLOGIES, INC. 发明人 LECHEMINANT GREG DAVIS;HART MICHAEL G
分类号 G01R13/20;G01R13/02;G01R23/16;G09G5/00;G09G5/32;(IPC1-7):G01R13/00 主分类号 G01R13/20
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