发明名称 Method of manufacturing a mask ROM semiconductor device
摘要 Disclosed is a method of manufacturing a semiconductor device including a gate electrode on a semiconductor substrate through a gate insulated film; source/drain regions formed to be adjacent to the gate electrode; and an Al wiring formed through an interlayer insulating film covering the gate electrode, wherein impurity ions are implanted in a surface layer of the substrate using the Al wiring and a photoresist formed thereon as a mask, and wherein no photoresist is formed on the Al wiring arranged above regions in which the impurity ions are implanted in adjacent elements.
申请公布号 US6576518(B1) 申请公布日期 2003.06.10
申请号 US20020091991 申请日期 2002.03.06
申请人 SANYO ELECTRIC CO., LTD. 发明人 YAMADA JUNJI;YAMADA YUTAKA;ARIYOSHI JUNICHI
分类号 H01L21/8246;H01L27/112;(IPC1-7):H01K21/824 主分类号 H01L21/8246
代理机构 代理人
主权项
地址