发明名称 Method for forming a thin film transistor with a lightly doped drain structure
摘要 A method for forming a thin film transistor with lightly doped drain structure comprising the steps of forming a gate insulating layer and a gate electrode on a polysilicon layer; forming a photoresist layer with a predetermined thickness on the gate electrode and on a portion of the polysilicon layer; and implanting first conductive type impurities into the polysilicon layer so as to form a first ion-implant region and a second ion-implant region, wherein the doping concentration of the second ion-implant region is higher than that of the first ion-implant region.
申请公布号 US6576403(B2) 申请公布日期 2003.06.10
申请号 US20000752900 申请日期 2000.12.27
申请人 HANNSTAR DISPLAY CORPORATION 发明人 KUNG JI-HO;CHEN CHIH-CHANG
分类号 H01L21/336;H01L21/77;H01L21/8238;H01L21/84;H01L27/08;H01L27/092;H01L27/12;H01L29/786;(IPC1-7):H01L21/00;H01L21/823 主分类号 H01L21/336
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