发明名称 |
Method for forming a thin film transistor with a lightly doped drain structure |
摘要 |
A method for forming a thin film transistor with lightly doped drain structure comprising the steps of forming a gate insulating layer and a gate electrode on a polysilicon layer; forming a photoresist layer with a predetermined thickness on the gate electrode and on a portion of the polysilicon layer; and implanting first conductive type impurities into the polysilicon layer so as to form a first ion-implant region and a second ion-implant region, wherein the doping concentration of the second ion-implant region is higher than that of the first ion-implant region.
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申请公布号 |
US6576403(B2) |
申请公布日期 |
2003.06.10 |
申请号 |
US20000752900 |
申请日期 |
2000.12.27 |
申请人 |
HANNSTAR DISPLAY CORPORATION |
发明人 |
KUNG JI-HO;CHEN CHIH-CHANG |
分类号 |
H01L21/336;H01L21/77;H01L21/8238;H01L21/84;H01L27/08;H01L27/092;H01L27/12;H01L29/786;(IPC1-7):H01L21/00;H01L21/823 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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