发明名称 Device and method for automatic calibration of a microelectromechanical structure included in a control loop
摘要 A sensing device having a microelectromechanical structure made of semiconductor material, and a control loop for controlling the microelectromechanical structure, the microelectromechanical structure including a stator element and a rotor element electrostatically coupled together, and the control loop including a position interface supplying a position signal indicative of the position of the rotor element, and a one-bit quantizer receiving the position signal and supplying a corresponding bit sequence. The sensing device further includes a calibration device for calibrating the microelectromechanical structure, including a microactuator made of semiconductor material and coupled to the rotor element, and a driving circuit for driving the microactuator, and receiving the bit sequence and supplying to the microactuator a driving signal correlated to a mean value of the bit sequence in a given time window.
申请公布号 US6577975(B2) 申请公布日期 2003.06.10
申请号 US20010001269 申请日期 2001.11.13
申请人 STMICROELECTRONICS S.R.L. 发明人 CHIESA ENRICO
分类号 G01D3/028;G01D3/06;G01P15/00;G01P15/08;G01P15/125;G01P15/13;G01P21/00;(IPC1-7):G01C17/38 主分类号 G01D3/028
代理机构 代理人
主权项
地址
您可能感兴趣的专利