发明名称 METHOD FOR CONNECTING POWER METAL LINES OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for connecting power metal lines of a semiconductor device is provided to reduce resistance by greatly broadening an area for connecting upper and lower power supply lines as compared with a conventional hole. CONSTITUTION: An interlayer dielectric is deposited on a lower metal line and a photoresist layer is applied to the interlayer dielectric. A reticle or mask including a plurality of holes is located on the photoresist layer. An exposure/development process is performed over a critical interval of time so that a photoresist layer pattern is formed in which hole patterns are interconnected. The interlayer dielectric is etched to expose the lower power metal line by using the photoresist layer pattern as a mask. The photoresist layer pattern is eliminated and the etched portion of the interlayer dielectric is filled with a conductive material.
申请公布号 KR20030044693(A) 申请公布日期 2003.06.09
申请号 KR20010075537 申请日期 2001.11.30
申请人 ANAM SEMICONDUCTOR., LTD. 发明人 LEE, DAE GEUN
分类号 H01L21/3205;(IPC1-7):H01L21/320 主分类号 H01L21/3205
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