发明名称 |
METHOD FOR CONNECTING POWER METAL LINES OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for connecting power metal lines of a semiconductor device is provided to reduce resistance by greatly broadening an area for connecting upper and lower power supply lines as compared with a conventional hole. CONSTITUTION: An interlayer dielectric is deposited on a lower metal line and a photoresist layer is applied to the interlayer dielectric. A reticle or mask including a plurality of holes is located on the photoresist layer. An exposure/development process is performed over a critical interval of time so that a photoresist layer pattern is formed in which hole patterns are interconnected. The interlayer dielectric is etched to expose the lower power metal line by using the photoresist layer pattern as a mask. The photoresist layer pattern is eliminated and the etched portion of the interlayer dielectric is filled with a conductive material.
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申请公布号 |
KR20030044693(A) |
申请公布日期 |
2003.06.09 |
申请号 |
KR20010075537 |
申请日期 |
2001.11.30 |
申请人 |
ANAM SEMICONDUCTOR., LTD. |
发明人 |
LEE, DAE GEUN |
分类号 |
H01L21/3205;(IPC1-7):H01L21/320 |
主分类号 |
H01L21/3205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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