发明名称 |
METHOD FOR MANUFACTURING MEMORY CELL |
摘要 |
PROBLEM TO BE SOLVED: To simplify the step of manufacturing a double charge storage location memory cell. SOLUTION: A dielectric stack 120 is disposed over the entire upper side surface of a structure. A contact opening 121 is formed in the dielectric layer 120 lowered to the surface of a bit line diffused part 115 of the specified region at the outside of the memory cell sub-array. Metal bit lines 123A, 123B are specified to cross a word line 119 on the bit line diffused part 115 so as to bring into contact with the position corresponding to the specified region by a normal contact forming technique and a metallization technique. The metal bit line restricts the voltage drop along the bit line diffused part 115. COPYRIGHT: (C)2003,JPO
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申请公布号 |
JP2003163294(A) |
申请公布日期 |
2003.06.06 |
申请号 |
JP20020294069 |
申请日期 |
2002.10.07 |
申请人 |
STMICROELECTRONICS SRL |
发明人 |
CAPRARA PAOLO;BRAMBILLA CLAUDIO;CEREDA MANLIO SERGIO |
分类号 |
H01L21/8247;H01L21/8246;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):H01L21/824 |
主分类号 |
H01L21/8247 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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