发明名称 METHOD FOR MANUFACTURING MEMORY CELL
摘要 PROBLEM TO BE SOLVED: To simplify the step of manufacturing a double charge storage location memory cell. SOLUTION: A dielectric stack 120 is disposed over the entire upper side surface of a structure. A contact opening 121 is formed in the dielectric layer 120 lowered to the surface of a bit line diffused part 115 of the specified region at the outside of the memory cell sub-array. Metal bit lines 123A, 123B are specified to cross a word line 119 on the bit line diffused part 115 so as to bring into contact with the position corresponding to the specified region by a normal contact forming technique and a metallization technique. The metal bit line restricts the voltage drop along the bit line diffused part 115. COPYRIGHT: (C)2003,JPO
申请公布号 JP2003163294(A) 申请公布日期 2003.06.06
申请号 JP20020294069 申请日期 2002.10.07
申请人 STMICROELECTRONICS SRL 发明人 CAPRARA PAOLO;BRAMBILLA CLAUDIO;CEREDA MANLIO SERGIO
分类号 H01L21/8247;H01L21/8246;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):H01L21/824 主分类号 H01L21/8247
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