发明名称 METHOD FOR DETECTING LOGIC STATE REPRESENTED BY INPUT SIGNAL AND SEMICONDUCTOR INTEGRATED CIRCUIT
摘要 PROBLEM TO BE SOLVED: To provide a method for detecting a logic state represented by an input signal and a semiconductor integrated circuit in which the data value of a received signal can be exactly identified or detected. SOLUTION: A receiver apparatus 100 to be utilized for the method for detecting the logic state represented by the input signal is provided with a data receiving unit 130. The data receiving unit 130 is provided with a sampling circuit 10, a reference signal generating circuit 20 connected to the sampling circuit 10, a determining circuit 26 connected to the sampling circuit 10 and the reference signal generating circuit 20, a latch circuit 32 connected to the determining circuit 26, and a selector circuit 38 connected to the latch circuit 32. The reference signal generating circuit 20 generates a reference voltage on the basis of the voltage of an input signal received before and the determining circuit 26 determines the logic state represented by the voltage of an input signal received at present on the basis of the reference voltage. COPYRIGHT: (C)2003,JPO
申请公布号 JP2003163705(A) 申请公布日期 2003.06.06
申请号 JP20020253434 申请日期 2002.08.30
申请人 SAMSUNG ELECTRONICS CO LTD 发明人 NOH KWANG-SOOK
分类号 H03K5/08;G11C7/00;H04L25/02;H04L25/03;H04L25/06;(IPC1-7):H04L25/03 主分类号 H03K5/08
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