发明名称 DIELECTRIC FILM, CAPACITOR, SEMICONDUCTOR DEVICE, AND METHOD OF MANUFACTURING SAME
摘要 <P>PROBLEM TO BE SOLVED: To provide a dielectric film, a capacitor, and a semiconductor device preferable for preventing deteriorations in leak current characteristics and dielectric characteristics caused by residual purities in a film while substantially securing charged capacitance, and to provide a method of manufacturing the same. <P>SOLUTION: The semiconductor device comprises a semiconductor substrate 21, a first gate insulation film portion 22a including aluminum on the semiconductor substrate, a second gate insulation film portion 22b including lithium on the first gate insulation film, and a gate electrode 23 on the second insulation film portion. <P>COPYRIGHT: (C)2003,JPO
申请公布号 JP2003163285(A) 申请公布日期 2003.06.06
申请号 JP20020235057 申请日期 2002.08.12
申请人 HYNIX SEMICONDUCTOR INC 发明人 LEE KEE-JEUNG;CHAE SU-JIN
分类号 H01L27/04;C23C16/40;H01L21/02;H01L21/28;H01L21/316;H01L21/822;H01L21/8242;H01L27/108;H01L29/51;H01L29/78 主分类号 H01L27/04
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