| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a sample rotating mechanism that enables a fluorescent X-ray analyzing instrument to analyze various samples having different properties with high accuracy, by rotating the samples in a displacement-free state without requiring time and labor for replacing stopper pieces, etc. <P>SOLUTION: The fluorescent X-ray analyzing instrument for analyzing fluorescent X-rays B2 emitted from a sample 10 when the sample 10 is irradiated with primary X-rays B1, is equipped with a sample rotating mechanism provided with a driving machine 22 which rotates a sample stage 7 supporting the sample 10, a speed control section 22 which controls the driving machine 22 to rotate the sample stage 7 at a plurality of different rotational speeds, and an input section 39 which inputs the value of the rotational speed of the stage 7 set in accordance with the properties of the sample 10 to the control section 22. The sample rotating mechanism rotates the sample stage 7 by setting the rotational speed of the stage 7 so that the sample 10 may not be displaced by a centrifugal force when the stage 7 is rotated. <P>COPYRIGHT: (C)2003,JPO</p> |
