发明名称 NONVOLATILE SEMICONDUCTOR STORAGE DEVICE AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a nonvolatile semiconductor storage device capable of preventing a disturbance. SOLUTION: The nonvolatile semiconductor storage device comprises a silicon substrate 1, and a floating gate electrode 9 formed on the substrate 1 via a gate insulating film 4. The gate electrode 9 has a lower conductive layer 7 formed on the gate insulating film 4 and having a first width W1 in a channel widthwise direction, and an upper conductive layer 8 formed on the lower conductive layer 7 and having a second width W2 larger than the first width W1 in the channel widthwise direction. COPYRIGHT: (C)2003,JPO
申请公布号 JP2003163290(A) 申请公布日期 2003.06.06
申请号 JP20010360842 申请日期 2001.11.27
申请人 MITSUBISHI ELECTRIC CORP 发明人 NAKATANI YASUO
分类号 H01L21/8247;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):H01L21/824 主分类号 H01L21/8247
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