| 摘要 |
PROBLEM TO BE SOLVED: To provide a simulator in which the effect of stress, or the like, onto the characteristics of an element can be evaluated quantitatively. SOLUTION: The simulator for evaluating the characteristics of a semiconductor device comprises a first calculating section for calculating a first value corresponding to a specified physical value for at least a partial region of the semiconductor device while taking account of a specified physical quantity, a second calculating section for calculating a second value corresponding to a physical value for at least a partial region of the semiconductor device without taking account of a physical quantity, and a visualizing section for displaying correlation of the first and second values in a specified form. COPYRIGHT: (C)2003,JPO
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