发明名称 Silicon film, semiconductor device, and process for forming silicon films
摘要 In a process for forming a silicon-based film on a substrate according to the present invention, the substrate has a temperature gradient in the thickness direction thereof in the formation of the silicon-based film and the temperature gradient is made such that a deposition surface of the substrate has a higher temperature than a backside or the direction of the temperature gradient is reversed. With this configuration, the present invention provides a silicon-based thin film having good properties at a high deposition rate and provide a semiconductor device including it. The present invention also provides a semiconductor device including the silicon-based thin films that has good adhesion and weather-resisting properties and that can be manufactured in a short tact time.
申请公布号 US2003104664(A1) 申请公布日期 2003.06.05
申请号 US20020113675 申请日期 2002.04.02
申请人 KONDO TAKAHARU;OKABE SHOTARO;SANO MASAFUMI;SAKAI AKIRA;KODA YUZO;HAYASHI RYO;SUGIYAMA SHUICHIRO;MORIYAMA KOICHIRO 发明人 KONDO TAKAHARU;OKABE SHOTARO;SANO MASAFUMI;SAKAI AKIRA;KODA YUZO;HAYASHI RYO;SUGIYAMA SHUICHIRO;MORIYAMA KOICHIRO
分类号 H01L21/205;C23C16/46;C23C16/505;C23C16/52;C23C16/54;H01L21/336;H01L21/365;H01L21/8238;H01L29/786;H01L31/04;H01L31/075;H01L31/18;H01L31/20;(IPC1-7):H01L21/823 主分类号 H01L21/205
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