| 摘要 |
PURPOSE: An apparatus for testing an analog-digital converter is provided to simplify a structure, perform a test process within a short period of time, and capture digital output data of N-times by using an oscillator and an N-frequency divider. CONSTITUTION: An apparatus for testing an analog-digital converter includes an oscillator(100), a frequency divider(102), a driver(104), a sine wave generator(106), a mixing signal IC(108), and a comparator(110). The oscillator(100) is used for generating the first clock signal. The frequency divider(102) is used for dividing the first clock signal by N. The driver(104) is used for generating the second clock signal and a control signal in response to the divided clock signals. The sine wave generator(106) is synchronized with the second clock signal to generate a sine-wave analog signal. The mixing signal IC(108) includes an analog-digital converter to convert the sine-wave analog signal to a digital signal in response to the first clock signal and the control signal. The comparator(110) is used for deciding a normal state of the analog-digital converter by comparing the converted digital signal with a predetermined digital value.
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