发明名称 Storage system determines faulty memory cells of main memory and accesses auxiliary memory cell allocated to faulty address provided in auxiliary memory cell when faulty address is detected
摘要 The storage system has a main memory (1) with several memory cells having allocated main memory addresses. A test module (3) determines faulty memory cells of the main memory and puts the allocated main memory addresses as fault addresses into an auxiliary memory (2). An evaluation module (4) compares the main memory address with the faulty address when the main memory is accessed. An auxiliary memory cell allocated to the faulty address provided in the auxiliary memory is accessed when the evaluation module detects a conformance of the main memory address with the faulty addresses.
申请公布号 DE10155418(A1) 申请公布日期 2003.06.05
申请号 DE20011055418 申请日期 2001.11.12
申请人 INFINEON TECHNOLOGIES AG 发明人 ECKER, WOLFGANG
分类号 G11C29/00;G11C29/44;(IPC1-7):G11C29/00 主分类号 G11C29/00
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