发明名称 Surface inspection system
摘要 A surface inspection system for projecting a laser beam to a surface of a substrate and for detecting a foreign object by detecting scattered reflection light of the laser beam, comprising a light source unit having a plurality of light emitting sources for emitting the laser beams, and a projecting optical system for projecting the laser beam from each of the light emitting sources to the surface of the substrate.
申请公布号 US2003103203(A1) 申请公布日期 2003.06.05
申请号 US20020252763 申请日期 2002.09.23
申请人 ISOZAKI HISASHI;ENOMOTO YOSHIYUKI 发明人 ISOZAKI HISASHI;ENOMOTO YOSHIYUKI
分类号 H01L21/66;G01N21/95;(IPC1-7):G01N21/88 主分类号 H01L21/66
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