发明名称 Electrical test probes and methods of making the same
摘要 A probe plunger and method of making are provided. The probe plunger includes an outer layer of a relatively hard, relatively low contact resistance such as a palladium-cobalt alloy. In some embodiments, a portion of the exterior surface includes at least one region of a self-limiting oxide.
申请公布号 US2003102877(A1) 申请公布日期 2003.06.05
申请号 US20020254054 申请日期 2002.09.24
申请人 SOUZA THERESA R.;NELSON LARRE 发明人 SOUZA THERESA R.;NELSON LARRE
分类号 G01R1/067;G01R3/00;(IPC1-7):G01R31/02 主分类号 G01R1/067
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