发明名称 |
Electrical test probes and methods of making the same |
摘要 |
A probe plunger and method of making are provided. The probe plunger includes an outer layer of a relatively hard, relatively low contact resistance such as a palladium-cobalt alloy. In some embodiments, a portion of the exterior surface includes at least one region of a self-limiting oxide.
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申请公布号 |
US2003102877(A1) |
申请公布日期 |
2003.06.05 |
申请号 |
US20020254054 |
申请日期 |
2002.09.24 |
申请人 |
SOUZA THERESA R.;NELSON LARRE |
发明人 |
SOUZA THERESA R.;NELSON LARRE |
分类号 |
G01R1/067;G01R3/00;(IPC1-7):G01R31/02 |
主分类号 |
G01R1/067 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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