发明名称 X-RAY EXAMINING DEVICE, AND ITS CONTROL METHOD AND ITS ADJUSTING METHOD
摘要 A plurality of X−ray detector means are moved with respect to an object to be examined and fixedly positioned. An X−ray applying means is moved or rotated depending on the positions of the detector means. The obtained fluoroscopic image data is displayed as one synthesized image. A small−sized high−performance X−ray examining device by which the time required from detection to image display is shortened is thus provided.
申请公布号 WO03046532(A1) 申请公布日期 2003.06.05
申请号 WO2002JP12119 申请日期 2002.11.20
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.;OMORI, KOICHI;YONEDA, TOSHIKAZU;KAWASAKI, MORIAKI;INO, YOSHIHIRO;NAKAJIMA, HIROSHI;ISHINO, HISAHIDE;BABA, SUEKI 发明人 OMORI, KOICHI;YONEDA, TOSHIKAZU;KAWASAKI, MORIAKI;INO, YOSHIHIRO;NAKAJIMA, HIROSHI;ISHINO, HISAHIDE;BABA, SUEKI
分类号 G01N23/04;(IPC1-7):G01N23/04 主分类号 G01N23/04
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