发明名称 Monolithic infrared focal plane array detectors
摘要 An infrared sensing device including a multi-layer II-VI semiconductor material grown by molecular beam epitaxy on a readout circuit fabricated on silicon substrate having a orientation one degree tilted from the (100) direction is provided in this invention. A method to grow single crystalline mercury cadmium telluride multi-layer structure on custom-designed readout circuit (ROIC) is provided. Due to the height difference of more than 15 micron between the two planes containing the detector output gates and the ROIC signal input gates, a mesa with at least one sloped side is fabricated and the interconnecting metal electrodes running on them to connect the detector output to ROIC input. Planar photovoltaic junctions are fabricated selectively on the II-VI mesa structure formed on ROIC. At least one infrared detecting cell being formed in the mesa, with a conductor interconnect layer connecting the detection cell to the readout integrated circuit. Another design to simultaneously produce two linear arrays of monolithic infrared detectors is provided by the suitable design of the ROIC input pads and the infrared detector arrays.
申请公布号 US2003102432(A1) 申请公布日期 2003.06.05
申请号 US20010833363 申请日期 2001.04.12
申请人 EPIR LTD. 发明人 BOIERIU PAUL;ASHOKAN RENGANATHAN;CHEN YUANPING;FAURIE JEAN-PIERRE;SIVANANTHAN SIVALINGAM
分类号 H01L27/146;(IPC1-7):G01T1/24;H01L27/14 主分类号 H01L27/146
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