发明名称 Polishing apparatus
摘要 A polishing apparatus for polishing a workpiece such as a semiconductor wafer includes a polishing section (130) for polishing a surface of the workpiece held by the top ring (137), a cleaning section (150) for cleaning the workpiece which has been polished in the polishing section (130). The polishing apparatus further includes a workpiece transfer robot (1) for transferring the workpiece to be polished to the polishing section (130) or the workpiece which has been polished in the cleaning section (150). The workpiece transfer robot (1) comprises a robot body (10), at least one arm (25) operatively coupled to the robot body (10) by at least one joint (37), a holder mechanism (50) mounted on the arm (25) for holding a workpiece, and a sealing mechanism (41) provided at the joint (37) for preventing liquid from entering an interior of the joint (37). <IMAGE>
申请公布号 EP0827809(B1) 申请公布日期 2003.06.04
申请号 EP19970115193 申请日期 1997.09.02
申请人 EBARA CORPORATION 发明人 TOGAWA, TETSUJI
分类号 B23Q7/04;B23Q7/14;B24B37/30;B24B41/00;B24B41/06;B25J19/00;H01L21/677;(IPC1-7):B24B37/04 主分类号 B23Q7/04
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