System testing device and method using a JTAG circuit

摘要

A system testing device and method comprises a JTAG circuit provided with a JTAG instruction storage unit for storing a command to control a system logic circuit and a JTAG data storage unit for storing data used to control the system logic circuit, and tests the system logic circuit in an LSI by selectively inputting/outputting data to a boundary scan register, a bypass register, the JTAG instruction storage unit, and the JTAG data storage unit.