发明名称 Dual metal gate CMOS devices and method for making the same
摘要 A method of fabricating a dual metal gate CMOS includes forming a gate oxide in a gate region and depositing a place-holder gate in each of a n-well and p-well; removing the place-holder gate and gate oxide; depositing a high-k dielectric in the gate region; depositing a first metal in the gate region of the p-well; depositing a second metal in the gate region of each of the n-well and p-well; and insulating and metallizing the structure. A dual metal gate CMOS of the invention includes PMOS transistor and a NMOS transistor. In the NMOS, a gate includes a high-k cup, a first metal cup formed in the high-k cup, and a second metal gate formed in the first metal cup. In the PMOS, a gate includes a high-k cup and a second metal gate formed in the high-k cup.
申请公布号 US6573134(B2) 申请公布日期 2003.06.03
申请号 US20010817834 申请日期 2001.03.27
申请人 SHARP LABORATORIES OF AMERICA, INC. 发明人 MA YANJUN;ONO YOSHI;EVANS DAVID R.;HSU SHENG TENG
分类号 H01L21/28;H01L21/8238;H01L27/092;H01L29/423;H01L29/43;H01L29/49;(IPC1-7):H01L21/823 主分类号 H01L21/28
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