Automatic LDMOS biasing with long term hot carrier compensation

摘要

Disclosed are systems and methods for automatic biasing of LDMOS devices at turn-on. The invention provides bias point setting with compensation for hot carrier effects each time the LDMOS device is turned on and also provides temperature compensation during operation of the device. The systems and methods of the invention are scalable such that a plurality of LDMOS devices may simultaneously have their bias points set, and temperature compensation provided.