BIPOLAR-CMOS-DMOS DEVICE AND FABRICATING METHOD THEREOF
摘要
PURPOSE: A method for fabricating a Bipolar-CMOS-DMOS(BCD) device is provided to fabricate a BCD device that has voltage tolerance of 20-30 volt and 60-90 volt and gate oxide layers of different thicknesses by using a CMOS device process of a submicron class. CONSTITUTION: Only a drift region is formed under a drain region of a lateral double diffused MOS(LDMOS) device of 20-30 volt class while a drift region is formed under a drain region of 60-90 volt class so that a well region is formed to improve voltage tolerance and an on-resistance characteristic. A gate oxide layer of an nLDMOS device is made thin while a gate oxide layer of a pLDMOS device is made thick so that a gate apply voltage is increased to improve driving capability. A device occupying area is reduced by isolating devices while using a trench. A drift region of a DMOS device is formed to simplify a process by using a mask for forming the base of a bipolar device.
申请公布号
KR20030042654(A)
申请公布日期
2003.06.02
申请号
KR20010073392
申请日期
2001.11.23
申请人
ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
发明人
KIM, JONG DAE;KOO, JIN GEUN;LEE, DAE U;NOH, TAE MUN;PARK, IL YONG;YANG, IL SEOK