发明名称 METHOD FOR REMOVING ASSIST FEATURES UTILIZED TO IMPROVE PROCESS LATITUDE
摘要 PURPOSE: A method for removing assist features utilized for improving process latitude is provided to effectively remove, from a substrate, unwanted residues in the assist feature to be used for optical proximity compensation when a feature pattern is printed on the substrate by using a lithographic projection system. CONSTITUTION: Which of the features require assist features to be disposed adjacent thereto is determined so as to print the features to be printed on the substrate within the predetermined resolution limit. A mask containing the features to be printed and the assist features thereof is generated. The first illumination process is performed to print the features on the substrate resulting in the partial printing of the assist features on the substrate. The second illumination process with the quadrapole illumination using a mask as the negative mask of the assist feature pattern is performed so as to reduce the amount of the assist features to be printed on the substrate.
申请公布号 KR20030043772(A) 申请公布日期 2003.06.02
申请号 KR20020074751 申请日期 2002.11.28
申请人 ASML MASKTOOLS B.V. 发明人 EURLINGS MARKUS FRANCISCUS ANTONIUS;HSU DUAN FU STEPHEN;CHEN JANG FUNG
分类号 G03F1/00;G03F7/20;H01L21/027 主分类号 G03F1/00
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