发明名称 RESIST PATTERN THICKENING MATERIAL, RESIST PATTERN AND FORMING METHOD THEREOF, AND SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
摘要 PURPOSE: A resist pattern thickening material, a resist pattern and a forming method thereof, and a semiconductor device and a manufacturing method thereof are provided to be capable of simply forming a fine resist removing pattern at low cost and improving the etching-resistance of the resist pattern. CONSTITUTION: After forming a resist pattern(3) at the upper portion of a lower layer(5), a resist pattern thickening material layer(1) is coated on the surface of the resist pattern. Then, a pre-baking process is carried out at the resultant structure for forming a coating layer. A mixing layer(10a) is formed between the resist pattern and the resist pattern thickening material layer by the mixing phenomenon between the resist pattern and the resist pattern thickening material layer.
申请公布号 KR20030043756(A) 申请公布日期 2003.06.02
申请号 KR20020074280 申请日期 2002.11.27
申请人 FUJITSU LIMITED 发明人 KOZAWA MIWA;NOZAKI KOJI;NAMIKI TAKAHISA;KON JUNICHI;YANO EI
分类号 H01L21/027;(IPC1-7):H01L21/027 主分类号 H01L21/027
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