发明名称 |
RESIST PATTERN THICKENING MATERIAL, RESIST PATTERN AND FORMING METHOD THEREOF, AND SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF |
摘要 |
PURPOSE: A resist pattern thickening material, a resist pattern and a forming method thereof, and a semiconductor device and a manufacturing method thereof are provided to be capable of simply forming a fine resist removing pattern at low cost and improving the etching-resistance of the resist pattern. CONSTITUTION: After forming a resist pattern(3) at the upper portion of a lower layer(5), a resist pattern thickening material layer(1) is coated on the surface of the resist pattern. Then, a pre-baking process is carried out at the resultant structure for forming a coating layer. A mixing layer(10a) is formed between the resist pattern and the resist pattern thickening material layer by the mixing phenomenon between the resist pattern and the resist pattern thickening material layer.
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申请公布号 |
KR20030043756(A) |
申请公布日期 |
2003.06.02 |
申请号 |
KR20020074280 |
申请日期 |
2002.11.27 |
申请人 |
FUJITSU LIMITED |
发明人 |
KOZAWA MIWA;NOZAKI KOJI;NAMIKI TAKAHISA;KON JUNICHI;YANO EI |
分类号 |
H01L21/027;(IPC1-7):H01L21/027 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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