发明名称 ATOMIC LAYER DEPOSITION OF COPPER USING A REDUCING GAS AND NON-FLUORINATED COPPER PRECURSORS
摘要 Methods of forming copper films by sequentially introducing and then reacting nitrogen containing analogs of Copper II ss-diketonates which analogs are more stable source reagents for copper deposition. The nitrogen containing analogs replace -O- with -N(R")- wherein R" is an alkyl group having from one to four carbon atoms. Replacement of each -O- is preferred although replacement of one -O- per cyclic ring is sufficient to improve stability of the copper source reagents. The source reagent can be purified by sublimation to remove solvents and excess ligands prior to semiconductor processing. The processing chamber is preferably a cyclical deposition chamber maintained at a pressure of less than about 10 Torr and the substrate is maintained at a temperature of about 50 to about 200 DEG C.
申请公布号 WO03044242(A2) 申请公布日期 2003.05.30
申请号 WO2002US36713 申请日期 2002.11.15
申请人 APPLIED MATERIALS, INC. 发明人 CHEN, LING;CHANG, MEI
分类号 C23C16/18;C23C16/44;C23C16/455;H01L21/285;H01L21/768 主分类号 C23C16/18
代理机构 代理人
主权项
地址