发明名称 X-RAY INSPECTION DEVICE AND CONTROLLING METHOD AND ADJUSTING METHOD OF THE SAME
摘要 <p>PROBLEM TO BE SOLVED: To solve such a problem that a device gets large in a case of moving a specimen when the specimen is wide compared with a detection range of a detecting means, a problem that the resolution gets worsened in a method in which a subject area is widened by keeping an X-ray emitting means and the X-ray detecting means apart from the specimen, and a program that the device is required to compactified, to display a plurality partial radioscopic image data as one composited image data without lowering the resolution, and to shorten the time from the detection to the image display. SOLUTION: The plurality of X-ray detecting means are moved with respect to the specimen positioned and fixed, the X-ray emitting means is moved or rotated in response to a position of the detecting means, and the plural obtained radioscopic data are displayed as the one composition image.</p>
申请公布号 JP2003156454(A) 申请公布日期 2003.05.30
申请号 JP20010359240 申请日期 2001.11.26
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 OOMORI YASUICHI;YONEDA SHUNICHI;KAWASAKI MORIAKI;INO YOSHIHIRO;NAKAJIMA HIROSHI;ISHINO HISAHIDE;BABA MATSUKI
分类号 G01N23/04;(IPC1-7):G01N23/04 主分类号 G01N23/04
代理机构 代理人
主权项
地址