发明名称 TEST PLATE-DIVIDING APPARATUS OF SEMICONDUCTOR TEST MEMBER
摘要 PROBLEM TO BE SOLVED: To arrange at least one inspection reception element at a region corresponding to a test plate and to provide a means that has its own point and can reduce noise interference. SOLUTION: At least one inspection reception element is arranged at a section corresponding to a test plate, and the own point is possessed.
申请公布号 JP2003156535(A) 申请公布日期 2003.05.30
申请号 JP20010356335 申请日期 2001.11.21
申请人 CHIN BUNCHI 发明人 CHIN BUNCHI
分类号 G01R31/28;(IPC1-7):G01R31/28 主分类号 G01R31/28
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