发明名称 CHARGED PARTICLE BEAM DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a charged particle beam device which can easily set up conditions of WD most suitable for observation. SOLUTION: A means is provided for displaying WD most suitable for an objective of observation or moving a stage toward the WD, by specifying acceleration voltage, a sample slanting angle, and a detector to be used as minimum informations needed for the observation.
申请公布号 JP2003157791(A) 申请公布日期 2003.05.30
申请号 JP20010353949 申请日期 2001.11.20
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 KOGASHIWA TAKESHI;SATO MITSUGI
分类号 H01J37/20;H01J37/244;H01J37/28;(IPC1-7):H01J37/28 主分类号 H01J37/20
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