发明名称 DEVICE FOR EVALUATING CONTENT OF SILICON DIOXIDE
摘要 PROBLEM TO BE SOLVED: To provide a device for evaluating the content of silicon dioxide in a phosphoric acid bus and to provide a system for etching silicon nitride. SOLUTION: The device evaluates the content of silicon dioxide in the phosphoric acid bus etching silicon nitride. The device is provided with a sensor (5) measuring the concentration of NH3 in the phosphoric acid bus, a storage unit (8) storing data regulating the relation between the content of silicon dioxide and the concentration of NH3 , and a device (7) calculating the content of silicon dioxide based on the measured concentration of NH3 and stored data.
申请公布号 JP2003158116(A) 申请公布日期 2003.05.30
申请号 JP20020295110 申请日期 2002.10.08
申请人 INFINEON TECHNOLOGIES AG 发明人 OTTOW STEFAN;STEUER ULF
分类号 G01N1/28;G01N21/35;H01L21/00;H01L21/306;H01L21/311;(IPC1-7):H01L21/306 主分类号 G01N1/28
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