发明名称 METHOD AND APPARATUS FOR THREE-DIMENSIONAL COMPOSITIONAL MAPPING OF HETEROGENEOUS MATERIALS
摘要 <p>Laser ablation combined with spectrometric analysis is a good tool for determining the composition of heterogeneous materials. By measuring the depth of an ablation crater at a target of a heterogeneous material, it is possible to generate a compositional profile as a function of the depth. It is also possible to generate a 3 dimensional profile by depth profiling of a plurality of craters. The depth measurement is conducted in situ and in real time so that the evolution of composition as a fucntion of the depth can be measured. An interferometric technique with a short coherence length light is one of the preferred embodiments for measuring the depth in situ and in real time.</p>
申请公布号 WO2003044502(A1) 申请公布日期 2003.05.30
申请号 CA2002001747 申请日期 2002.11.15
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